Tue, 09/21/2010 - 13:41
(NIST: Gaithersburg, MD) -- Siemens PLM Software’s new NX CMM Inspection Programming application, the latest addition to the NX software part-manufacturing solutions, has become the first inspection programming software application officially…
Wed, 09/15/2010 - 12:17
(NIST: Gaithersburg, MD) -- The panel of judges for the Malcolm Baldrige National Quality Award, the nation’s highest recognition for organizational performance excellence, has selected 16 organizations for the final review stage for the 2010 award…
Mon, 09/13/2010 - 06:00
With growing interest in using nanoparticles for everything from antibacterial socks to medical imaging to electronic devices, the need to understand the environmental, health, and safety risks of these particles also grows. Researchers at the…
Wed, 09/08/2010 - 06:00
(NIST: Gaithersburg, MD) -- Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a microminiaturized device that can perform complex viscosity measurements—critical data for a wide variety of…
Thu, 08/19/2010 - 06:00
(NIST: Gaithersburg, MD) -- NIST will use the new ultra-dark detector, described in a new paper in Nano Letters, to make precision laser power measurements for advanced technologies such as optical communications, laser-based manufacturing, solar…
Mon, 08/09/2010 - 06:00
(NIST: Gaithersburg, MD) -- A wrench or a screwdriver of a single size is useful for some jobs, but for a more complicated project, you need a set of tools of different sizes. Following this guiding principle, researchers at the National Institute…
Tue, 08/03/2010 - 16:08
(NIST: Gaithersburg, MD) -- The Baldrige Fellows, an executive development program centered on forming relationships with and learning from Baldrige National Quality Award recipient organizations and their senior executives, recently announced the…
Fri, 07/23/2010 - 15:54
Ravikiran Attota, a lead researcher in NIST’s Precision Engineering Division, won an R&D 100 Award for his development of through-focus scanning optical microscopy (TSOM), which has applications that cut across a range…
Wed, 07/21/2010 - 17:22
(NIST: Gaithersburg, MD) -- For more than a decade, the Baldrige Regional Conferences have been a valuable forum for recipients of the Malcolm Baldrige National Quality Award to showcase their exceptional performance practices. This year, the…
Wed, 07/07/2010 - 07:54
(NIST: Gaithersburg, MD) -- Have you ever wanted to suggest changes or improvements to the Baldrige Criteria for Performance Excellence? Do you have ideas for improving the Baldrige Award process, examiner training, or other key Baldrige program…