Mon, 06/08/2009 - 01:00
(NIST: Gaithersburg, Maryland) -- By combining the best of two different distance measurement approaches with a super-accurate technology called an optical frequency comb, researchers at the National Institute of Standards and Technology (NIST)…
Wed, 06/03/2009 - 11:53
(NIST: Gaithersburg, Maryland) -- The National Institute of Standards and Technology (NIST) announced today that it will award up to $35 million in grants and cooperative agreements for measurement science and engineering research. Approximately 20…
Tue, 06/02/2009 - 16:48
Baldrige award medallion.
(NIST: Gaithersburg, MD) -- Seventy organizations have taken the first step toward the 2009 Malcolm Baldrige National Quality Award, the nation’s highest…
Mon, 04/20/2009 - 13:36
(NIST: Gaithersburg, Maryland) -- The U.S. Commerce Department’s National Institute of Standards and Technology (NIST) has announced a three-phase plan to expedite development of key standards for a smart grid, a nationwide network that uses…
Thu, 03/19/2009 - 11:23
(NIST: Gaithersburg, Maryland) -- In a tour de force of measurement science, researchers at the National Institute of Standards and Technology (NIST) have developed and issued for sale a new test material for calibrating quality control equipment…
Tue, 08/12/2008 - 22:00
(NIST: Gaithersburg, Maryland) -- The National Institute of Standards and Technology and the University of Maryland Biotechnology Institute (UMBI) will cosponsor an international conference on “Accelerating Innovation in 21st Century Biosciences:…
Mon, 06/23/2008 - 22:00
(NIST: Gaithersburg, Maryland) -- The Baldrige National Quality Program strives to continuously improve all aspects of the program to deliver greater value to its customers and stakeholders and to improve the effectiveness of our processes. To that…
Wed, 04/09/2008 - 22:00
Heart of the orthogonal tracking microscope system developed at NIST is this nanoparticle solution sample well etched in silicon. Careful orientation of the silicon crystal makes it possible to chemically etch angled sides in…
Wed, 03/14/2007 - 22:00
(National Institute of Standards and Technology, Washington, D.C.) -- A new report from the National Institute of Standards and Technology (NIST), An Assessment of the United States Measurement System: Addressing Measurement Barriers to Accelerate…