Tue, 12/20/2011 - 13:31
(Nikon Metrology: Brighton, MI) -- Focus 10, Nikon Metrology’s point-cloud software that streamlines the digital inspection process, offers a completely new user interface and now provides support for handheld laser scanning and tactile probing…
Tue, 11/01/2011 - 12:37
(Nikon Metrology: Brighton, MI) -- More than 100 metrology and manufacturing professionals gathered to visit the new Nikon Metrology Technology Center, located at the company’s Headquarters for the Americas in Brighton, Michigan. The event…
Tue, 11/01/2011 - 11:47
(Nikon Metrology: Brighton, MI) -- Nikon Metrology’s SHUTTLEPIX Digital Microscope has been awarded the Good Design Award 2011, which is a comprehensive program for the evaluation and encouragement of design organized by the Japan Institute of…
Tue, 10/25/2011 - 10:30
(Nikon: Brighton, MI) -- More than 100 metrology and manufacturing professionals gathered to visit the new Nikon Metrology Inc. Technology Center, located at the company’s headquarters for the Americas in Brighton, Michigan. The purpose of the…
Tue, 08/30/2011 - 11:53
The EU’s co-funded COMET project, which seeks to improve the efficiency of European industrial manufacturing, is creating a revolutionary solution that enables robots to perform high-end machining. Robots of any brand fitted with the COMET plug-…
Wed, 08/10/2011 - 12:12
(Nikon Metrology: Brighton, MI) -- Nikon Metrology has announced that Alex Lucas, the company’s business development manager for scanning products, will be presenting the Xtreme Scanning Innovation Brief at the Quality Expo Show in Chicago. This…
Wed, 06/15/2011 - 10:49
(Nikon: Leuven, Belgium) -- Nikon Metrology introduces CAMIO7, featuring a new metrology software interface that redefines 3-D tactile and laser CMM inspection. With fewer mouse clicks and instant access to programming functions from a single…
Mon, 05/09/2011 - 12:39
(Nikon Metrology: Brighton, MI) -- CAMIO7 is a major software release in many ways. This multisensor coordinate measuring machine (CMM) software now reflects the latest from Microsoft Windows, featuring the ribbon-style toolbar. This serves as…
Tue, 04/12/2011 - 13:49
(Nikon Metrology: Leuven, Belgium) -- At archaeological sites, drawing of contexts, sections, and site plans can easily consume a huge part of the total excavation time. For particularly complicated and detailed sites, this can even rise to as…
Fri, 03/25/2011 - 09:30
(Nikon Metrology: Brighton, MI) -- Nikon Metrology has introduced its latest stereoscopic microscope, the SMZ-745. The airtight, anti-electrostatic, and anti-mold design of the microscope prevents samples from being damaged by electrostatic…