Nils Anspach

Applications and sales manager

DME Nanotechnologie GmbH

Nils Anspach has been working with broad spectrum microscopy techniques since 2001 in the interdisciplinary field between nano physics and live science in the academic and industrial environment. His main topics are the characterization of single molecule interactions and NCD surface coatings. As an application and sales manager at DME, he acts as the contact for customers and project partners during customized SPM system development and provides application support.

Wed, 10/02/2013 - 12:20
Using Atomic Force Microscopy With a Scanning Electron Microscope Zeiss’ AFM option for its MERLIN series helps characterize nanostructures
Wed, 10/02/2013 - 12:20
The AFM Option for the ZEISS MERLIN series combines a high-end, atomic force microscope (AFM) with a scanning electron microscope (SEM) to produce in situ, high-resolution AFM measurements in the SEM. The combination opens up new possibilities for…