Frank Hitzel

CEO

DME Nanotechnologie GmbH

Frank F. Hitzel has been the head of DME Nanotechnologie in Germany since 2008. With a background in software development and semiconductor physics, he has a decade of experience in the development of electronics and software for scanning probe microscopes and other embedded systems. He has spent the past 15 years working with scanning probe microscopy.

 

Wed, 10/02/2013 - 12:20
Using Atomic Force Microscopy With a Scanning Electron Microscope Zeiss’ AFM option for its MERLIN series helps characterize nanostructures
Wed, 10/02/2013 - 12:20
The AFM Option for the ZEISS MERLIN series combines a high-end, atomic force microscope (AFM) with a scanning electron microscope (SEM) to produce in situ, high-resolution AFM measurements in the SEM. The combination opens up new possibilities for…