Wed, 10/02/2013 - 12:20
The AFM Option for the ZEISS MERLIN series combines a high-end, atomic force microscope (AFM) with a scanning electron microscope (SEM) to produce in situ, high-resolution AFM measurements in the SEM. The combination opens up new possibilities for…
Endré Majorovits
Author
Endré Majorovits’ experience in transmission electron microscopy (TEM) spans the past decade and a half. He is currently a specialist in helium ion microscopy at Carl Zeiss Microscopy in Oberkochen, Germany, and has been a specialist in electron microscopy at Zeiss for the past six years. His career began in academia at the Max Planck Institute for Medical Research (MPI) in Heidelberg, Germany, where he focused on technical application development for TEM and on TEM applications in biological research using cryo-electron microscopy. He has also conducted research on immunology and virology at Oxford University.
Wed, 10/02/2013 - 12:20